Publications
Filters: Author is Shin, Seung Jun [Clear All Filters]
Probability-enhanced sufficient dimension reduction for binary classification." Biometrics 70, no. 3 (2014): 546-55.
"Probability-enhanced sufficient dimension reduction for binary classification." Biometrics 70, no. 3 (2014): 546-55.
"Probability-enhanced sufficient dimension reduction for binary classification." Biometrics 70, no. 3 (2014): 546-55.
"Probability-enhanced sufficient dimension reduction for binary classification." Biometrics 70, no. 3 (2014): 546-55.
"Probability-enhanced sufficient dimension reduction for binary classification." Biometrics 70, no. 3 (2014): 546-55.
"Probability-enhanced sufficient dimension reduction for binary classification." Biometrics 70, no. 3 (2014): 546-55.
"Probability-enhanced sufficient dimension reduction for binary classification." Biometrics 70, no. 3 (2014): 546-55.
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